Technical Specifications

• Number of Channels:
  • Total Channels: 96 digital I/O channels
• I/O Voltage Levels:
  • Input Voltage Range: 0 to 5 V
  • Output Voltage Levels: 0 to 5 V (TTL)
• I/O Type:
  • Digital Input/Output: TTL (Transistor-Transistor Logic)
• I/O Characteristics:
  • Input: 5 V tolerant
  • Output Drive Current: 24 mA per channel (sink or source)
• Timing and Control:
  • Update Rate: Up to 50 MHz (depending on system configuration and bus speed)
• Connector Type:
  • I/O Connector: 96-pin D-Sub connector
• Bus Interface:
  • PXIe interface for seamless integration with other PXIe modules and systems
• Power Requirements:
  • Voltage: 3.3 V and 5 V (provided through the PXIe backplane)
• Software Support:
  • Compatible with NI LabVIEW and other National Instruments software for programming and control

Functional Features

• High Channel Count:
  • The PXIe-6509 features 96 digital I/O channels, allowing for extensive digital data acquisition and control in a single module.
• Versatile I/O Capabilities:
  • Supports both digital input and output functions with TTL voltage levels, suitable for a wide range of applications.
• High-Speed Operation:
  • Capable of high-speed digital operations with update rates up to 50 MHz, depending on system configuration.
• High Drive Current:
  • Each channel can drive up to 24 mA, providing sufficient current for driving TTL logic levels or interfacing with external circuits.
• Flexible I/O Connector:
  • Uses a 96-pin D-Sub connector for easy integration with external devices and systems.
• Software Integration:
  • Fully supported by NI LabVIEW and other National Instruments software platforms, allowing for efficient programming and system control.
• Robust Timing and Control:
  • Offers precise timing and control features for synchronization with other digital and analog signals.

Application Scenarios

• Digital Data Acquisition:
  • Ideal for applications requiring high-density digital data acquisition, such as data logging, monitoring, and analysis.
• Automated Testing:
  • Used in automated test systems to control and monitor digital signals, facilitating high-throughput testing and validation processes.
• Industrial Automation:
  • Suitable for interfacing with industrial control systems, sensors, and actuators in automation environments.
• Embedded Systems:
  • Can be integrated into embedded systems for digital control and data acquisition tasks.
• Simulation and Control:
  • Useful for simulation applications where digital signals need to be generated or controlled in real-time.
• Prototyping and R&D:
  • Beneficial for prototyping and research and development projects that involve digital signal processing and control.