Technical Specifications

• Channels:
  • 2 channels per module
• Bandwidth:
  • Analog Bandwidth: 1 GHz
• Sampling Rate:
  • Up to 5 GS/s (gigasamples per second) per channel
• Vertical Resolution:
  • 12 bits
• Vertical Range:
  • Voltage Range: ±100 mV to ±5 V (full-scale)
• Input Coupling:
  • AC and DC coupling options
• Input Impedance:
  • 50 Ω or 1 MΩ (selectable)
• Memory Depth:
  • Up to 1 GB (gigabyte) per channel
• Triggering:
  • Advanced triggering capabilities, including edge, pulse width, and complex conditions
• Timebase:
  • Adjustable with high resolution for accurate timing control
• Connectivity:
  • PXIe interface for seamless integration with other PXIe instruments

Functional Features

• High-Speed Sampling:
  • Capable of sampling at up to 5 GS/s per channel, which is essential for capturing fast-changing and high-frequency signals.
• High Bandwidth:
  • Offers 1 GHz of analog bandwidth, allowing for accurate measurement of high-frequency signals and detailed analysis of complex waveforms.
• High Vertical Resolution:
  • 12-bit vertical resolution provides finer signal detail and improved measurement accuracy.
• Deep Memory:
  • Up to 1 GB of memory per channel allows for extensive data capture and detailed signal analysis over longer time periods or at higher sampling rates.
• Advanced Triggering:
  • Includes advanced triggering options to isolate specific signal events or conditions, aiding in precise data capture and analysis.
• Versatile Input Coupling:
  • Provides both AC and DC coupling options to accommodate a wide range of signal types and measurement needs.
• Software Integration:
  • Fully compatible with NI LabVIEW and other NI software platforms, enabling efficient programming, control, and comprehensive analysis of acquired data.

Application Scenarios

• High-Speed Signal Acquisition:
  • Ideal for capturing and analyzing very fast and high-frequency signals in applications such as communications, electronics, and semiconductor testing.
• Automated Test Systems:
  • Suitable for use in automated test systems where high-speed and high-resolution signal acquisition is critical for production, research, and development.
• Debugging and Validation:
  • Useful for debugging and validating electronic designs by capturing detailed transient events and anomalies with high accuracy.
• Research and Development:
  • Employed in R&D environments for the development and validation of new technologies and designs, providing detailed insights into high-speed signal behavior.
• Signal Integrity Testing:
  • Valuable for testing and ensuring the integrity of high-speed signal transmissions in electronic systems.
• Complex Signal Analysis:
  • Beneficial for scenarios requiring detailed analysis of complex signals, including precise timing and amplitude measurements.