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NI PXIe-5114

The NI PXIe-5114 is a high-performance digitizer module designed for precise and high-speed signal acquisition within PXIe (PCI eXtensions for Instrumentation Express) systems. It is part of National Instruments’ family of modular instruments, offering advanced capabilities for capturing and analyzing complex signals.

Detailed content

Technical Specifications

  • Channels:
    • 2 channels per module
  • Bandwidth:
    • Analog Bandwidth: 500 MHz
  • Sampling Rate:
    • Up to 2.5 GS/s (gigasamples per second) per channel
  • Vertical Resolution:
    • 8 bits
  • Vertical Range:
    • Voltage Range: ±1 V to ±10 V (full-scale)
  • Input Coupling:
    • AC and DC coupling options
  • Input Impedance:
    • 50 Ω or 1 MΩ (selectable)
  • Memory Depth:
    • Up to 256 MB (mega samples) per channel
  • Triggering:
    • Advanced triggering capabilities including edge, pulse width, and other complex trigger conditions
  • Timebase:
    • Adjustable timebase with high resolution for accurate timing control
  • Connectivity:
    • PXIe interface for seamless integration with other PXIe instruments

Functional Features

  • High-Speed Sampling:
    • Provides high-speed sampling at up to 2.5 GS/s per channel, allowing for detailed capture and analysis of fast and transient signals.
  • High Bandwidth:
    • With 500 MHz of analog bandwidth, the PXIe-5114 can measure high-frequency signals accurately, making it suitable for complex signal analysis.
  • Deep Memory:
    • Features up to 256 MB of memory per channel, facilitating extensive data capture and detailed signal analysis over long periods or at high sample rates.
  • Advanced Triggering:
    • Includes advanced triggering options to isolate specific signal events, which is essential for accurate and relevant data capture.
  • Versatile Input Coupling:
    • Provides both AC and DC coupling options to handle various signal types and measurement needs.
  • Software Integration:
    • Fully compatible with NI LabVIEW and other NI software platforms, enabling efficient programming, control, and analysis of measurement data.

Application Scenarios

  • High-Speed Signal Acquisition:
    • Ideal for capturing and analyzing high-speed and high-frequency signals in applications such as communications, electronics, and semiconductor testing.
  • Automated Test Systems:
    • Suitable for use in automated test systems where high-speed, precise signal acquisition is required for production, research, and development.
  • Debugging and Validation:
    • Useful for debugging and validating electronic designs by capturing transient events and signal anomalies with high accuracy.
  • Research and Development:
    • Employed in R&D environments for testing and analyzing high-speed signals, aiding in the development and validation of new technologies and designs.
  • Signal Integrity Testing:
    • Valuable for testing and ensuring the integrity of high-speed signal transmissions and electronic systems.
  • Complex Signal Analysis:
    • Beneficial in scenarios requiring detailed signal analysis, including timing and amplitude measurements for complex signals.

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