Technical Specifications

• Channels:
  • 2 channels per module
• Bandwidth:
  • Analog Bandwidth: 500 MHz
• Sampling Rate:
  • Up to 2.5 GS/s (gigasamples per second) per channel
• Vertical Resolution:
  • 8 bits
• Vertical Range:
  • Voltage Range: ±1 V to ±10 V (full-scale)
• Input Coupling:
  • AC and DC coupling options
• Input Impedance:
  • 50 Ω or 1 MΩ (selectable)
• Memory Depth:
  • Up to 256 MB (mega samples) per channel
• Triggering:
  • Advanced triggering capabilities including edge, pulse width, and other complex trigger conditions
• Timebase:
  • Adjustable with fine resolution for precise timing control
• Connectivity:
  • PXIe interface for integration with other PXIe instruments

Functional Features

• High-Speed Sampling:
  • The PXIe-5105 provides high-speed sampling up to 2.5 GS/s per channel, enabling detailed capture of fast-changing signals.
• High Bandwidth:
  • With a 500 MHz analog bandwidth, the module can accurately capture high-frequency signals, making it suitable for complex signal analysis.
• Deep Memory:
  • Large memory depth allows for extensive data capture and detailed signal analysis over long periods or at high sample rates.
• Advanced Triggering:
  • Offers sophisticated triggering options to isolate specific events or signal characteristics, aiding in precise and relevant data capture.
• Versatile Input Coupling:
  • Provides AC and DC coupling options to accommodate various types of signal measurement needs.
• Software Integration:
  • Fully compatible with NI LabVIEW and other NI software tools, enabling efficient programming, control, and analysis of acquired data.

Application Scenarios

• High-Speed Signal Analysis:
  • Ideal for applications requiring detailed analysis of high-speed and high-frequency signals, such as in communications, electronics, and semiconductor testing.
• Automated Test Systems:
  • Suitable for use in automated test environments where precise and high-speed signal acquisition is necessary for production and development testing.
• Debugging and Validation:
  • Useful for debugging and validating complex electronic designs by capturing and analyzing transient events and signal anomalies.
• Research and Development:
  • Employed in R&D applications to measure and analyze high-speed signals in the development and testing of new technologies.
• Signal Integrity Testing:
  • Valuable for testing and ensuring the integrity of high-speed signal transmissions in various electronic systems.
• Complex Triggering:
  • Utilized in scenarios where advanced triggering capabilities are required to capture specific signal events and conditions.