Technical Specifications

• Voltage Range:
  • Source: ±20 V
  • Measure: ±20 V
• Current Range:
  • Source: ±1 A
  • Measure: ±1 A
• Voltage Accuracy:
  • Source: ±0.02% of range
  • Measure: ±0.02% of range
• Current Accuracy:
  • Source: ±0.02% of range
  • Measure: ±0.02% of range
• Resolution:
  • Voltage Source Resolution: 24-bit
  • Current Source Resolution: 24-bit
  • Voltage Measurement Resolution: 24-bit
  • Current Measurement Resolution: 24-bit
• Programming Rate:
  • Up to 200 kS/s (source and measure)
• Compliance Limits:
  • Programmable over-voltage and over-current protection
• Channel Count:
  • Single channel
• Connectivity:
  • PXIe interface for integration with other PXIe instruments

Functional Features

• Precision Sourcing and Measurement:
  • The PXIe-4162 offers high-accuracy sourcing and measurement capabilities for both voltage and current, with low noise and high resolution, ideal for precise electronic testing.
• High-Speed Performance:
  • Provides fast sourcing and measurement rates up to 200 kS/s, making it suitable for applications requiring rapid data acquisition.
• Advanced Calibration:
  • Includes features for advanced calibration to ensure long-term accuracy and stability, which is crucial for maintaining performance in demanding applications.
• Built-in Protection:
  • Features programmable over-voltage and over-current protection to protect both the instrument and the device under test (DUT) from damage.
• Versatile Test Modes:
  • Supports a range of test modes, including constant voltage, constant current, and combined sourcing, providing flexibility for various testing scenarios.
• Software Integration:
  • Fully compatible with NI LabVIEW and NI-DMM (Digital Multimeter) drivers, which simplifies integration into automated test systems and offers a comprehensive environment for programming and control.

Application Scenarios

• Device Characterization:
  • Ideal for detailed characterization of electronic components such as resistors, capacitors, diodes, and transistors, providing accurate sourcing and measurement for various tests.
• Battery Testing:
  • Suitable for analyzing batteries, including measuring their charge and discharge characteristics, capacity, and performance under different operating conditions.
• Power Supply Testing:
  • Used to test power supplies by sourcing different voltages and measuring their performance under various loads to ensure they meet specifications.
• Automated Test Systems:
  • Commonly integrated into automated test systems used in production, research, and development environments due to its precision, flexibility, and ease of integration with NI software.
• Reliability and Stress Testing:
  • Employed for stress testing and reliability evaluations of electronic components and systems by applying controlled electrical stresses and assessing their performance.
• Advanced Circuit Testing:
  • Suitable for testing and analyzing complex circuits and systems where accurate control and measurement of electrical parameters are essential.