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NI PXIe-4142

The NI PXIe-4142 is a high-performance source measure unit (SMU) module designed for precise electrical measurement and sourcing within a PXIe (PCI eXtensions for Instrumentation Express) system. This SMU is tailored for applications that require high accuracy, flexibility, and speed in both sourcing and measurement.

Detailed content

Technical Specifications

  • Voltage Range:
    • Source: ±40 V
    • Measure: ±40 V
  • Current Range:
    • Source: ±3 A
    • Measure: ±3 A
  • Voltage Accuracy:
    • Source: ±0.02% of range
    • Measure: ±0.02% of range
  • Current Accuracy:
    • Source: ±0.02% of range
    • Measure: ±0.02% of range
  • Resolution:
    • Voltage Source Resolution: 24-bit
    • Current Source Resolution: 24-bit
    • Voltage Measurement Resolution: 24-bit
    • Current Measurement Resolution: 24-bit
  • Programming Rate:
    • Up to 200 kS/s (source and measure)
  • Compliance Limits:
    • Programmable for over-voltage and over-current protection
  • Channel Count:
    • Single channel
  • Connectivity:
    • PXIe interface for integration with other PXIe instruments

Functional Features

  • Precision Measurement and Sourcing:
    • The PXIe-4142 offers high-accuracy voltage and current sourcing and measurement with very low noise, making it suitable for precise electrical testing.
  • High-Speed Operation:
    • Capable of high-speed sourcing and measurement with rates up to 200 kS/s, allowing for rapid data acquisition and processing.
  • Advanced Calibration:
    • Features advanced calibration capabilities to ensure long-term accuracy and stability, maintaining reliable performance in various applications.
  • Built-in Protection:
    • Includes programmable over-voltage and over-current protection to prevent damage to the instrument and the device under test (DUT).
  • Versatile Test Modes:
    • Supports multiple test configurations such as constant voltage, constant current, and combined sourcing, providing flexibility for different types of tests.
  • Software Integration:
    • Compatible with NI LabVIEW and NI-DMM (Digital Multimeter) drivers, which simplifies integration into automated test systems and provides a robust environment for programming and control.

Application Scenarios

  • Device Characterization:
    • Ideal for detailed characterization of electronic components and devices like resistors, capacitors, diodes, and transistors through accurate sourcing and measurement.
  • Battery Testing:
    • Suitable for testing and analyzing batteries, including their charge and discharge cycles, capacity, and performance under varying conditions.
  • Power Supply Testing:
    • Used for evaluating the performance of power supplies by sourcing different voltages and measuring their response under various loads.
  • Automated Test Systems:
    • Commonly integrated into automated test systems for production, research, and development due to its precision and ease of integration with NI software platforms.
  • Reliability and Stress Testing:
    • Employed in stress testing and reliability analysis by applying controlled electrical stress to components and systems to evaluate their performance and durability.
  • Advanced Circuit Testing:
    • Suitable for testing complex circuits and systems where precise control and measurement of electrical parameters are required.

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