NI PXIe-4142
The NI PXIe-4142 is a high-performance source measure unit (SMU) module designed for precise electrical measurement and sourcing within a PXIe (PCI eXtensions for Instrumentation Express) system. This SMU is tailored for applications that require high accuracy, flexibility, and speed in both sourcing and measurement.
Detailed content
Technical Specifications
- Voltage Range:
- Source: ±40 V
- Measure: ±40 V
- Current Range:
- Source: ±3 A
- Measure: ±3 A
- Voltage Accuracy:
- Source: ±0.02% of range
- Measure: ±0.02% of range
- Current Accuracy:
- Source: ±0.02% of range
- Measure: ±0.02% of range
- Resolution:
- Voltage Source Resolution: 24-bit
- Current Source Resolution: 24-bit
- Voltage Measurement Resolution: 24-bit
- Current Measurement Resolution: 24-bit
- Programming Rate:
- Up to 200 kS/s (source and measure)
- Compliance Limits:
- Programmable for over-voltage and over-current protection
- Channel Count:
- Single channel
- Connectivity:
- PXIe interface for integration with other PXIe instruments
Functional Features
- Precision Measurement and Sourcing:
- The PXIe-4142 offers high-accuracy voltage and current sourcing and measurement with very low noise, making it suitable for precise electrical testing.
- High-Speed Operation:
- Capable of high-speed sourcing and measurement with rates up to 200 kS/s, allowing for rapid data acquisition and processing.
- Advanced Calibration:
- Features advanced calibration capabilities to ensure long-term accuracy and stability, maintaining reliable performance in various applications.
- Built-in Protection:
- Includes programmable over-voltage and over-current protection to prevent damage to the instrument and the device under test (DUT).
- Versatile Test Modes:
- Supports multiple test configurations such as constant voltage, constant current, and combined sourcing, providing flexibility for different types of tests.
- Software Integration:
- Compatible with NI LabVIEW and NI-DMM (Digital Multimeter) drivers, which simplifies integration into automated test systems and provides a robust environment for programming and control.
Application Scenarios
- Device Characterization:
- Ideal for detailed characterization of electronic components and devices like resistors, capacitors, diodes, and transistors through accurate sourcing and measurement.
- Battery Testing:
- Suitable for testing and analyzing batteries, including their charge and discharge cycles, capacity, and performance under varying conditions.
- Power Supply Testing:
- Used for evaluating the performance of power supplies by sourcing different voltages and measuring their response under various loads.
- Automated Test Systems:
- Commonly integrated into automated test systems for production, research, and development due to its precision and ease of integration with NI software platforms.
- Reliability and Stress Testing:
- Employed in stress testing and reliability analysis by applying controlled electrical stress to components and systems to evaluate their performance and durability.
- Advanced Circuit Testing:
- Suitable for testing complex circuits and systems where precise control and measurement of electrical parameters are required.