NI PXIe-4141
The NI PXIe-4141 is a high-performance source measure unit (SMU) module designed for precision electrical measurement and sourcing in PXIe (PCI eXtensions for Instrumentation Express) systems. It is part of National Instruments’ suite of instruments that deliver advanced capabilities for electronic testing and characterization.
Detailed content
Technical Specifications
- Voltage Range:
- Source: ±40 V
- Measure: ±40 V
- Current Range:
- Source: ±2 A
- Measure: ±2 A
- Voltage Accuracy:
- Source: ±0.02% of range
- Measure: ±0.02% of range
- Current Accuracy:
- Source: ±0.02% of range
- Measure: ±0.02% of range
- Resolution:
- Voltage Source Resolution: 24-bit
- Current Source Resolution: 24-bit
- Voltage Measurement Resolution: 24-bit
- Current Measurement Resolution: 24-bit
- Programming Rate:
- Up to 200 kS/s (source and measure)
- Compliance Limits:
- Programmable for over-voltage and over-current protection
- Channel Count:
- Single channel
- Connectivity:
- PXIe interface for integration with other PXIe instruments
Functional Features
- High Precision Sourcing and Measurement:
- The PXIe-4141 provides precise voltage and current sourcing and measurement with high accuracy and low noise, suitable for demanding test applications.
- High-Speed Performance:
- Offers fast sourcing and measurement capabilities with rates up to 200 kS/s, enabling efficient data acquisition and processing.
- Advanced Calibration:
- Includes advanced calibration features to maintain accuracy and stability over time, ensuring reliable performance in long-term applications.
- Built-in Protection:
- Equipped with programmable over-voltage and over-current protection to safeguard both the instrument and the device under test (DUT).
- Versatile Operation Modes:
- Supports various modes of operation, including constant voltage, constant current, and combined voltage and current sourcing, providing flexibility for different testing requirements.
- Software Integration:
- Compatible with NI LabVIEW and NI-DMM drivers, facilitating seamless integration into automated test systems and simplifying programming and control.
Application Scenarios
- Device Characterization:
- Ideal for characterizing electronic components and devices, including resistors, capacitors, diodes, and transistors, through accurate voltage and current sourcing and measurement.
- Battery Testing:
- Suitable for testing and analyzing batteries by measuring charge and discharge cycles, capacity, and performance under various conditions.
- Power Supply Testing:
- Used for evaluating power supplies by sourcing different voltages and measuring their output characteristics under different load conditions.
- Automated Test Systems:
- Commonly integrated into automated test systems for both production and research applications, due to its precision, flexibility, and ease of integration with NI software.
- Reliability and Stress Testing:
- Employed in stress testing and reliability assessments by applying controlled electrical stress to components and systems, evaluating their performance under various conditions.
- Advanced Circuit Testing:
- Suitable for testing and analyzing complex circuits and systems where accurate and flexible control and measurement of electrical parameters are necessary.