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NI PXIe-4139

The NI PXIe-4139 is a precision source measure unit (SMU) designed for high-performance electrical measurement and sourcing in PXIe (PCI eXtensions for Instrumentation Express) systems. It provides a range of advanced features for precise control and measurement of voltage and current, making it suitable for demanding test and characterization applications.

Detailed content

Technical Specifications

  • Voltage Range:
    • Source: ±40 V
    • Measure: ±40 V
  • Current Range:
    • Source: ±3 A
    • Measure: ±3 A
  • Voltage Accuracy:
    • Source: ±0.02% of range
    • Measure: ±0.02% of range
  • Current Accuracy:
    • Source: ±0.02% of range
    • Measure: ±0.02% of range
  • Resolution:
    • Voltage Source Resolution: 24-bit
    • Current Source Resolution: 24-bit
    • Voltage Measurement Resolution: 24-bit
    • Current Measurement Resolution: 24-bit
  • Programming Rate:
    • Up to 200 kS/s (source and measure)
  • Compliance Limits:
    • Programmable over-voltage and over-current protection
  • Channel Count:
    • Single channel
  • Connectivity:
    • PXIe interface for integration with other PXIe instruments

Functional Features

  • Precision Sourcing and Measurement:
    • The PXIe-4139 provides high-accuracy voltage and current sourcing and measurement capabilities, with low noise and high resolution, making it ideal for precise testing.
  • High-Speed Performance:
    • Capable of fast sourcing and measurement rates, enabling rapid data acquisition and processing for high-speed testing applications.
  • Advanced Calibration:
    • Features advanced calibration capabilities to ensure accuracy and stability over time, enhancing reliability in long-term applications.
  • Built-in Protection:
    • Includes programmable over-voltage and over-current protection limits to safeguard both the instrument and the device under test (DUT).
  • Software Integration:
    • Fully compatible with NI LabVIEW and NI-DMM drivers, which facilitates seamless integration into automated test systems and simplifies programming and control.
  • Versatile Test Configurations:
    • Supports multiple operation modes, including constant voltage, constant current, and combined voltage and current sourcing, providing flexibility in test setups.

Application Scenarios

  • Device Characterization:
    • Ideal for characterizing various electronic components and devices, such as resistors, capacitors, diodes, and transistors, through precise voltage and current sourcing and measurement.
  • Battery Testing:
    • Suitable for testing and analyzing batteries, including measuring their charge and discharge characteristics, capacity, and performance under different conditions.
  • Power Supply Testing:
    • Used for evaluating power supplies by sourcing different voltage levels and measuring their output characteristics under various load conditions.
  • Automated Test Systems:
    • Commonly integrated into automated test systems for both production and research applications, owing to its precision, flexibility, and ease of integration with NI software.
  • Reliability and Stress Testing:
    • Employed in stress testing and reliability assessments of electronic components and systems by applying controlled electrical stress and evaluating performance.
  • Advanced Circuit Testing:
    • Suitable for testing complex circuits and systems where accurate and flexible control and measurement of electrical parameters are required.

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