Technical Specifications

• Voltage Range:
  • Source: ±40 V
  • Measure: ±40 V
• Current Range:
  • Source: ±3 A
  • Measure: ±3 A
• Voltage Accuracy:
  • Source: ±0.02% of range
  • Measure: ±0.02% of range
• Current Accuracy:
  • Source: ±0.02% of range
  • Measure: ±0.02% of range
• Resolution:
  • Voltage Source Resolution: 24-bit
  • Current Source Resolution: 24-bit
  • Voltage Measurement Resolution: 24-bit
  • Current Measurement Resolution: 24-bit
• Programming Rate:
  • Up to 200 kS/s (source and measure)
• Compliance Limits:
  • Programmable over-voltage and over-current protection
• Channel Count:
  • Single channel
• Connectivity:
  • PXIe interface for integration with other PXIe instruments

Functional Features

• High Precision and Flexibility:
  • The PXIe-4136 provides high-accuracy voltage and current measurements with precise control, ideal for a range of testing scenarios. It can source and measure voltage and current with high resolution.
• Dynamic Performance:
  • Capable of fast sourcing and measurement rates, making it suitable for applications that require rapid data acquisition and processing.
• Advanced Calibration:
  • Equipped with advanced calibration features to ensure accuracy and stability over time, maintaining reliable performance in critical applications.
• Built-in Protection:
  • Includes programmable limits for over-voltage and over-current protection to safeguard both the unit and the device under test (DUT).
• Integrated Software Support:
  • Fully supported by NI LabVIEW and NI-DMM (Digital Multimeter) drivers, which simplifies integration into automated test systems and provides a robust software environment for programming and control.
• Versatile Operation Modes:
  • Supports various operation modes such as constant voltage, constant current, and combined voltage and current sourcing, allowing flexibility in testing configurations.

Application Scenarios

• Device Characterization:
  • Ideal for characterizing a wide range of electronic components and systems, including resistors, capacitors, semiconductors, and integrated circuits, by providing precise voltage and current sourcing and measurement.
• Battery Testing:
  • Suitable for testing batteries and other energy storage devices, including measuring their charge and discharge cycles, capacity, and efficiency.
• Power Supply Testing:
  • Used for testing and evaluating power supplies by sourcing different voltage levels and measuring the output characteristics under various load conditions.
• Automated Test Systems:
  • Commonly integrated into automated test systems for both production and research environments due to its high precision, flexibility, and ease of integration with NI software platforms.
• Reliability and Stress Testing:
  • Employed in reliability and stress testing applications to apply controlled electrical stress to components and systems, assessing their performance and robustness under various conditions.
• Advanced Circuit Testing:
  • Suitable for complex circuit testing and analysis where precise control and measurement of electrical parameters are required.