Technical Specifications

• Voltage Range:
  • Source: ±20 V
  • Measure: ±20 V
• Current Range:
  • Source: ±2 A
  • Measure: ±2 A
• Voltage Accuracy:
  • Source: ±0.02% of range
  • Measure: ±0.02% of range
• Current Accuracy:
  • Source: ±0.02% of range
  • Measure: ±0.02% of range
• Resolution:
  • Voltage Source Resolution: 24-bit
  • Current Source Resolution: 24-bit
  • Voltage Measurement Resolution: 24-bit
  • Current Measurement Resolution: 24-bit
• Programming Rate:
  • Up to 200 kS/s (source and measure)
• Compliance Limits:
  • Programmable for over-voltage and over-current protection
• Channel Count:
  • Single channel
• Connectivity:
  • PXIe interface for integration with other PXIe instruments

Functional Features

• High Precision:
  • The PXIe-4135 delivers high-accuracy voltage and current measurements with low noise and high resolution, making it suitable for precision testing.
• Flexible Sourcing and Measuring:
  • Offers precise voltage and current sourcing with programmable settings, and can simultaneously measure voltage and current with high accuracy.
• Advanced Calibration:
  • Includes advanced calibration capabilities to ensure long-term stability and accuracy.
• Dynamic Performance:
  • Capable of fast measurement and sourcing rates, making it ideal for high-speed testing applications.
• Integrated Software:
  • Compatible with NI LabVIEW and NI-DMM drivers, facilitating easy integration into automated test systems and simplifying programming.
• Built-in Protection:
  • Features programmable limits for over-voltage and over-current protection to safeguard both the device under test (DUT) and the SMU.

Application Scenarios

• Device Characterization:
  • Used for precise characterization of electronic components such as resistors, capacitors, diodes, and transistors by sourcing and measuring voltage and current.
• Battery Testing:
  • Ideal for testing and characterizing batteries, including measuring their charge and discharge characteristics under various conditions.
• Power Supply Testing:
  • Suitable for testing power supplies by sourcing different voltages and measuring their response to different loads.
• Automated Test Systems:
  • Commonly integrated into automated test systems for production and research due to its precision, flexibility, and ease of integration with NI software.
• Reliability Testing:
  • Used for stress testing and reliability analysis of electronic devices by applying controlled electrical stress and measuring the responses.
• Advanced Circuit Testing:
  • Suitable for testing complex circuits and systems where precise control and measurement of voltage and current are required.